High precision measurements along the rp-process path
D. Galaviz,*A.M. Amthor, D. Bazin, A. Brown, A. Cole, T. Elliot, A. Estrade, Z. Fülöp, A. Gade, T. Glasmacher, R. Kessler, G. Lorusso, M. Matos, F. Montes, W. Müller, J.G. Pereira, H. Schatz, B. Sherrill, F. Schertz, Y. Shimbara, E. Smith, A. Tamii, M. Wallace, R. Zegers
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