@inproceedings{Kordyasz:2010Be,
  author = "Kordyasz, Andrzej J.  and  Kowalczyk, M.  and  Bednarek, Wlodek  and  Bardelli, L.  and  Lavergne, L.  and  Sarnecki, J.  and  Kisielinski, M.  and  Brzozowski, A.  and  Pytel, K.  and  Tarasiuk, J.  and  Grabiec, P  and  Panas, Andrzej",
  title = "{Determination of Si wafer resistivity distributions by C-V measurements}",
  doi = "10.22323/1.098.0016",
  booktitle = "Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors {\textemdash} PoS(RD09)",
  year = 2010,
  volume = "098",
  pages = "016"
}