PoS - Proceedings of Science
Volume 098 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) - Thu 1 October Morning
Simulation of a Floating Gate device fabricated in standard CMOS technology for dosimetry applications
E.G. Villani
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Published on: June 28, 2010
DOI: https://doi.org/10.22323/1.098.0023
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