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Volume 098 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) - Fri 2 October Morning
Measurements of 3D Silicon Strip Sensors by two Manufacturers
M. Koehler,* S. Eckert, K. Jakobs, S. Kuehn, G. Pahn, U. Parzefal, C.M. Fleta, G. Pellegrini, M. Lozano, G.F. Dalla Betta, A. Zoboli, M. Boscardin, S. Ronchin, N. Zorzi, J. Haerkoenen, P. Luukka, T. Maenpaa, H. Moilanen, R. Bates, S. Houston, C. Parkes
*corresponding author
Full text: pdf
Published on: 2010 June 28
DOI: https://doi.org/10.22323/1.098.0031
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.