@inproceedings{Koehler:2010u9, author = "Koehler, Michael and Eckert, Simon and Jakobs, Karl and Kuehn, Susanne and Pahn, Gregor and Parzefal, Ulrich and Fleta, Celeste Maria and Pellegrini, Giulio and Lozano, Manuel and Dalla Betta, Gian-Franco and Zoboli, Andrea and Boscardin, Maurizio and Ronchin, Sabina and Zorzi, Nicola and Haerkoenen, Jaakko and Luukka, Panja and Maenpaa, Teppo and Moilanen, Henri and Bates, Richard and Houston, Sarah and Parkes, Chris", title = "{Measurements of 3D Silicon Strip Sensors by two Manufacturers}", doi = "10.22323/1.098.0031", booktitle = "Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors {\textemdash} PoS(RD09)", year = 2010, volume = "098", pages = "031" }