@inproceedings{Koehler:2010u9,
  author = "Koehler, Michael  and  Eckert, Simon  and  Jakobs, Karl  and  Kuehn, Susanne  and  Pahn, Gregor  and  Parzefal, Ulrich  and  Fleta, Celeste Maria  and  Pellegrini, Giulio  and  Lozano, Manuel  and  Dalla Betta, Gian-Franco  and  Zoboli, Andrea  and  Boscardin, Maurizio  and  Ronchin, Sabina  and  Zorzi, Nicola  and  Haerkoenen, Jaakko  and  Luukka, Panja  and  Maenpaa, Teppo  and  Moilanen, Henri  and  Bates, Richard  and  Houston, Sarah  and  Parkes, Chris",
  title = "{Measurements of 3D Silicon Strip Sensors by two Manufacturers}",
  doi = "10.22323/1.098.0031",
  booktitle = "Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors {\textemdash} PoS(RD09)",
  year = 2010,
  volume = "098",
  pages = "031"
}