PoS - Proceedings of Science
Volume 159 - XI Workshop on Resistive Plate Chambers and Related Detectors (RPC2012) - Performance of RPC systems
Aging test of high rate MRPC
Y. Wang, X. Fan*, J. Wang, H. Chen and D. Gonzalez Diaz
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Published on: December 04, 2012
DOI: https://doi.org/10.22323/1.159.0014
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