Main Image
Volume 167 - The 21st International Workshop on Vertex Detectors (Vertex 2012) - Session 3 Radiation Hardness
X-ray induced radiation damage in segmented p+n silicon sensors (for Jiaguo Zhang)
J. Zhang, E. Fretwurst, R. Klanner, J. Schwandt, J. Becker,* I. Kopsalis, I. Pintilie, M. Turcato
*corresponding author
Full text: pdf
Supplementary files
Published on: 2013 July 24
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.