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Volume 167 - The 21st International Workshop on Vertex Detectors (Vertex 2012) - Session 4 R/D and device and detector simulation
"Why p-type is Better than n-type" or Electric Field in Heavily Irradiated Silicon Detectors
G. Kramberger,* V. Cindro, I. Mandic, M. Mikuz, M. Milovanovic, M. Zavrtanik
*corresponding author
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Published on: 2013 July 24
Open Access
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