PoS - Proceedings of Science
Volume 167 - The 21st International Workshop on Vertex Detectors (Vertex 2012) - Session 4 R/D and device and detector simulation
"Why p-type is Better than n-type" or Electric Field in Heavily Irradiated Silicon Detectors
G. Kramberger*, V. Cindro, I. Mandić, M. Mikuz, M. Milovanovic and M. Zavrtanik
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Published on: July 24, 2013
DOI: https://doi.org/10.22323/1.167.0022
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