@article{Balossino:2015o1,
  author = "Balossino, Ilaria  and  Calvo, Daniela  and  DE REMIGIS, Paolo  and  Mattiazzo, Serena  and  Mazza, Giovanni  and  Wheadon, Richard",
  title = "{Test for the mitigation of the Single Event Upset for ASIC in 130 nm technology}",
  doi = "10.22323/1.213.0382",
  journal = "PoS",
  year = 2015,
  volume = "TIPP2014",
  pages = "382"
}