Stacking of SKA data: comparing uv-plane and and image-plane stacking
K.K. Knudsen,* L. Lindroos, W.H.T. Vlemmings, J.E. Conway, I. Marti-Vidal
*corresponding author
Published on:
May 29, 2015
DOI: https://doi.org/10.22323/1.215.0168
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