Volume 236 -
The 34th International Cosmic Ray Conference (ICRC2015) -
Cosmic Ray Physics: Methods, Techniques and Instrumentation
Pattern recognition study for different levels of UV background in JEM-EUSO experiment
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Published on:
August 18, 2016
DOI: https://doi.org/10.22323/1.236.0661
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Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.