PoS - Proceedings of Science
Volume 287 - The 25th International workshop on vertex detectors (Vertex 2016) - Session: New developments and detector R&D
SOI Monolithic pixel detector technology
Y. Arai* on behalf of the SOIPIX Collaboration
*corresponding author
Full text: pdf
Pre-published on: May 19, 2017
Published on: August 03, 2017
Abstract
Silicon-On-Insulator (SOI) technology has been regarded as a best match technology for monolithic radiation pixel detector from a very early stage. However, major issues can severely affect the operability of the detector, such as the back-gate effect, the coupling between sensors and readout electronics and Total Ionization effect (TID).
We proved to have solved these issues by developing new technologies such as buried well and double SOI wafer/process. Transistor performance degradation by radiation was studied in detail, and we can successfully increase radiation hardness more than 100 kGy(Si) by changing the dose level of the Lightly Doped Drain (LDD) region.
In addition, the layout size of the pixel circuit is shrunken by introducing PMOS and NMOS active merge technique. This enables much smaller layout size than conventional CMOS process while keeping high enough analog operation voltage.
The process technologies we developed and a few examples of SOI detectors are described.
DOI: https://doi.org/10.22323/1.287.0029
How to cite

Metadata are provided both in "article" format (very similar to INSPIRE) as this helps creating very compact bibliographies which can be beneficial to authors and readers, and in "proceeding" format which is more detailed and complete.

Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.