PoS - Proceedings of Science
Volume 301 - 35th International Cosmic Ray Conference (ICRC2017) - Session Cosmic-Ray Direct. CRD- instrumentation direct
Charge resolution of the ISS-CREAM SCD measured with a heavy-ion beam
G. Hong*, Y. Amare, T. Anderson, D. Angelaszek, N. Anthony, K. Cheryian, G.H. Choi, M. Copley, S. Coutu, L. Derome, L. Eraud, L. Hagenau, J.H. Han, H.G. Huh, Y.S. Hwang, H.J. Hyun, S. Im, H.B. Jeon, J.A. Jeon, S. Jeong, S.C. Kang, H.J. Kim, K.C. Kim, M.H. Kim, H.Y. Lee, J. Lee, M.H. Lee, J.F. Liang, J.T. Link, L. Lu, L. Lutz, A. Menchaca-Rocha, T. Mernik, J.W. Mitchell, S.I. Mognet, S. Morton, M. Nester, S. Nutter, O. Ofoha, H. Park, I.H. Park, J.M. Park, N. Picot-Clemente, R. Quinn, E.S. Seo, J.R. Smith, P. Walpole, R.P. Weinmann, J. Wu and Y.S. Yoonet al. (click to show)
Full text: pdf
Pre-published on: August 16, 2017
Published on: August 03, 2018
The Cosmic Ray Energetics And Mass experiment for the International Space Station (ISS-CREAM) is scheduled to be launched and installed on the ISS in August 2017, and will carry out a measurement of the energy and composition of energetic cosmic rays in space. The Silicon Charge Detector (SCD) will identify the charge of through-going cosmic rays. It consists of four layers, each with 2688 silicon pixels and associated electronics. The ISS-CREAM payload was delivered to the launch site, Kennedy Space Center, in August 2015 after the successful completion of integration and space environment tests. A heavy-ion beam, required to verify the capability of precision charge measurement of the SCD, became available at the European Organization for Nuclear Research (CERN) in November 2016. A prototype instrument using the same types of silicon pixel sensors and electronics installed in the SCD was placed in a heavy-ion beam composed of secondary ions ranging from helium to zinc. We present the charge resolution for each ion as a function of the number of layers used for charge measurement so that the improvement in charge resolution is clearly demonstrated as the number of layers for charge measurement increases.
DOI: https://doi.org/10.22323/1.301.0229
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