Main Image
Volume 322 - 5th International Conference on Micro-Pattern Gas Detectors (MPGD2017) - Main session
On-line and real-time thickness and density measurement for quality control of thin films using GEMs
R.M. Gutierrez
Full text: Not available
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.