During RUN 3 and RUN 4 at the Large Hadron Collider (LHC), the SAMPA chip will be used in the upgraded front end electronics of the ALICE (A Large Ion Collider Experiment) Time Projection Chamber (TPC) and Muon Chambers (MCH). Previously, it was reported that the SAMPA
V2 prototypes were susceptible to the high energy proton induced Single Event Latch-up (SEL) events. Further irradiation campaigns were required to find the source of SEL events in SAMPA
V2 prototypes, and to verify that the SEL sensitivity of final versions (V3 and V4) of the SAMPA chip was reduced or even completely removed. The irradiation campaigns were performed using the Heavy-Ion Facility (HIF) at UCL (Universitè Catholique de Louvain) in Belgium and the Single-Photon laser facility at IES (Institute of Electronics and Systems), Montpellier-France.
Investigation of Single Event Latch-up effects in the ALICE SAMPA ASIC
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Pre-published on:
May 20, 2019
Published on:
July 25, 2019
Abstract
DOI: https://doi.org/10.22323/1.343.0023
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Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.