RD53A chip susceptibility to electromagnetic conducted noise
March 06, 2020
April 21, 2020
The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on the integration strategies (grounding and shielding schemes) and operating conditions of future Pixel detectors. This paper presents a detailed analysis of the RD53A chip susceptibility to RF conducted disturbances in order to understand and address noise issues of RD53A Chip before the pixel upgrade installation.
How to cite
Metadata are provided both in "article" format (very similar to INSPIRE) as this helps creating
very compact bibliographies which can be beneficial to authors and
readers, and in "proceeding" format
which is more detailed and complete.