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Volume 373 - The 28th International Workshop on Vertex Detectors (Vertex2019) - Poster session
X-Ray measurements of radiation hard monolithic CMOS sensors at Diamond Light Source
M. Mironova,* K. Metodiev, P.P. Allport, I. Berdalović, D. Bortoletto, C. Buttar, R. Cardella, V. Dao, M. Dyndal, P.M. Freeman, L. Flores Sanz de Acedo, L. Gonella, T. Kugathasan, H. Pernegger, F. Piro, R. Plackett, P. Riedler, A. Sharma, E.J. Schioppa, I. Shipsey, C. Solans Sanchez, W. Snoeys, H. Wennlöf, D. Weatherill, D. Wood, S. Worm on behalf of the MALTA team
*corresponding author
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Pre-published on: 2020 February 03
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This contribution outlines the results of investigations into the effects of radiation damage in the mini-MALTA depleted monolithic pixel sensor prototype using a micro-focus X-ray beam at Diamond Light Source. The in-pixel photon response was measured for three different pixel design variations: one with the standard continuous $\mathrm{n^-}$ layer layout and standard front-end, and extra deep p-well and $\mathrm{n^-}$ gap designs with a modified front-end. The standard design showed a decrease of 12\% in pixel response after irradiation to 1e15 $\mathrm{n_{eq}/cm^2}$. The two new designs did not show a significant decrease in pixel response after irradiation.
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