Effect of SiPM correlated noise and Photo-Detection Efficiency into charge resolution
A. Nagai*, C.M. Alispach, M. Dalchenko, D. Della Volpe, M. Heller, L.D.M. Medina and T. Montaruli
August 01, 2021
March 18, 2022
This paper reports on the studies of the effect of SiPM photon detection efficiency and correlated noise on the charge resolution of cameras for Imaging Atmospheric Cherenkov Telescopes (IACTs) with the goal of finding the optimal over-voltage (difference between applied and breakdown voltages) value providing the best balance between these two parameters. SiPM devices are more robust against light than photomultipliers, and allow to achieve longer exposure to gamma-ray sources more easily than photomultipliers (PMTs). Nonetheless, their sensitivity in the range of wavelength beyond 500 nm, where the Night Sky Background increases, is higher than PMTs. Hence, filters on the camera entrance window can be used combined with anti-reflective and a dichroic coatings to cut out wavelengths longer than $\sim $540 nm. The importance of such coatings and their effect on the charge resolution are also discussed in this article. This study is done with the Monte Carlo simulation (i.e. $sim \_ telarray$ – simulation of the imaging atmospheric Cherenkov technique) and validated with measurements in the laboratory with calibrated light sources (one to mimic Cherenkov light and another for NSB). The studies are performed using SiPM devices produced by Hamamatsu and FBK. Results are compared with PMTs.
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