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Volume 167 - The 21st International Workshop on Vertex Detectors (Vertex 2012) - Session 3 Radiation Hardness
X-ray induced radiation damage in segmented p+n silicon sensors (for Jiaguo Zhang)
J. Zhang, E. Fretwurst, R. Klanner, J. Schwandt, J. Becker,* I. Kopsalis, I. Pintilie, M. Turcato
*corresponding author
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Published on: 2013 July 24
DOI: https://doi.org/10.22323/1.167.0019
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