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Volume 213 - Technology and Instrumentation in Particle Physics 2014 (TIPP2014) - Poster Session 10
Test for the mitigation of the Single Event Upset for ASIC in 130 nm technology
I. Balossino, D. Calvo, P. De Remigis,* S. Mattiazzo, G. Mazza, R. Wheadon
*corresponding author
Full text: pdf
Published on: 2015 July 03
DOI: https://doi.org/10.22323/1.213.0382
Open Access
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