Volume 301 -
35th International Cosmic Ray Conference (ICRC2017) -
Session Neutrino. NU-astrophysical neutrinos
Reliability studies for KM3NeT electronics: The FIDES method
Full text:
pdf
Pre-published on:
August 16, 2017
Published on:
August 03, 2018
Abstract
High reliability of electronics is crucial for those systems operating in hard conditions, in particular when in-situ maintenance is not possible, as it is the case for space or deep-sea projects. The KM3NeT infrastructure, whose first Detection Units are currently being deployed on the Mediterranean Sea at depths of 2500-3500 meters, has chosen the FIDES method as reliability technique to estimate the failure in time of the different electronics boards. In the present article, the application of the FIDES method to the electronics of the Digital Optical Modules of the KM3NeT neutrino telescope is described in detail.
DOI: https://doi.org/10.22323/1.301.1003
How to cite
Metadata are provided both in "article" format (very similar to INSPIRE) as this helps creating very compact bibliographies which can be beneficial to authors and readers, and in "proceeding" format which is more detailed and complete.
Open Access
Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.