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Volume 098 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) - Thu 1 October Morning
New Measurement of Lorentz angles for electrons and holes in silicon detectors
M. Schmanau,* W. De Boer, K.H. Hoffmann, A. Sabellek, M. Schneider, T. Schneider, V. Zhukov
*corresponding author
Full text: pdf
Published on: 2010 June 28
DOI: https://doi.org/10.22323/1.098.0022
Open Access
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