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Volume 098 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) - Fri 2 October Afternoon
Radiation detection: novel approaches and readout capabilities exploiting latchup topology via bipolar, MOSFET and MESFET transistors
A. Gabrielli,* E.G. Villani
*corresponding author
Full text: pdf
Published on: 2010 June 28
DOI: https://doi.org/10.22323/1.098.0039
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.