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Volume 098 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) - Fri 2 October Afternoon
Study of the Radiation-Hardness of VCSEL/PIN
K.K. Gan
Full text: pdf
Published on: 2010 June 28
DOI: https://doi.org/10.22323/1.098.0041
Open Access
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