Precision measurements of 20Na, 24Al, 28P, 32Cl, and 36K for the rp-process
C. Wrede*,
J.A. Clark,
C. Deibel,
T. Faestermann,
R. Hertenberger,
A. Parikh,
H.F. Wirth,
S. Bishop,
A. Chen,
K. Eppinger,
B.M. Freeman,
A. Garcia,
R. Kruecken,
O. Lepyoshkina,
G. Rugel and
K. Setoodehnia*: corresponding author
Published on:
July 06, 2011
DOI: https://doi.org/10.22323/1.100.0055
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