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Volume 240 - 1st EPS conference on Plasma Diagnostics (ECPD2015) - Session P1
Electronic Components Exposed To Nuclear Radiations In Iter Diagnostic Systems: Current Investigations And Perspectives
V. Martin,* L. Bertalot, J.M. Drevon, R. Reichle, S. Simrock, G. Vayakis, M. Walsh, J. Verbeeck, Y. Cao, M. Van Uffelen
*corresponding author
Full text: pdf
Published on: 2016 October 26
DOI: https://doi.org/10.22323/1.240.0091
Open Access
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