PoS - Proceedings of Science
Volume 370 - Topical Workshop on Electronics for Particle Physics (TWEPP2019) - Asic
Low-power SEE hardening techniques and error rate evaluation in 65nm readout ASICs
A. Caratelli,* S. Scarfi, G. Bergamin, D. Ceresa, J. De Clerq, K. Kloukinas, Y. Leblebici on behalf of the CMS Tracker Group
*corresponding author
Full text: pdf
Pre-published on: March 06, 2020
Published on: April 21, 2020
Single event radiation effects represent one of the main challenges for digital designs exposed to ionizing particles in high energy physics detectors. Radiation hardening techniques are based on redundancy, leading to a significant increase in power consumption and area overhead. This contribution will present the single event effects hardening techniques adopted in the pixel and strip readout ASICs of the PS modules for the CMS outer tracker upgrade in relation to power requirements and error rates. Cross section measurements on the silicon prototypes and expected error rates evaluated for the CMS tracker particle flux and spectrum will be presented.
DOI: https://doi.org/10.22323/1.370.0015
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