Main Image
Volume 370 - Topical Workshop on Electronics for Particle Physics (TWEPP2019) - Asic
Low-power SEE hardening techniques and error rate evaluation in 65nm readout ASICs
A. Caratelli
Full text: pdf
Pre-published on: 2020 March 06
Published on:
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.