PoS - Proceedings of Science
Volume 370 - Topical Workshop on Electronics for Particle Physics (TWEPP2019) - Asic
Low-power SEE hardening techniques and error rate evaluation in 65nm readout ASICs
A. Caratelli*, S. Scarfi, G. Bergamin, D. Ceresa, J. De Clerq, K. Kloukinas, Y. Leblebici  on behalf of the CMS Tracker Group
Full text: pdf
Pre-published on: March 06, 2020
Published on: April 21, 2020
Abstract
Single event radiation effects represent one of the main challenges for digital designs exposed to ionizing particles in high energy physics detectors. Radiation hardening techniques are based on redundancy, leading to a significant increase in power consumption and area overhead. This contribution will present the single event effects hardening techniques adopted in the pixel and strip readout ASICs of the PS modules for the CMS outer tracker upgrade in relation to power requirements and error rates. Cross section measurements on the silicon prototypes and expected error rates evaluated for the CMS tracker particle flux and spectrum will be presented.
DOI: https://doi.org/10.22323/1.370.0015
How to cite

Metadata are provided both in "article" format (very similar to INSPIRE) as this helps creating very compact bibliographies which can be beneficial to authors and readers, and in "proceeding" format which is more detailed and complete.

Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.