Main Image
Volume 167 - The 21st International Workshop on Vertex Detectors (Vertex 2012) - Session 4 R/D and device and detector simulation
"Why p-type is Better than n-type" or Electric Field in Heavily Irradiated Silicon Detectors
G. Kramberger,* V. Cindro, I. Mandic, M. Mikuz, M. Milovanovic, M. Zavrtanik
*corresponding author
Full text: pdf
Published on: 2013-07-24 16:26:12
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.