Volume 098 -
9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) -
Thu 1 October Morning
Determination of Si wafer resistivity distributions by C-V measurements
Full text:
pdf
Published on:
June 28, 2010
DOI: https://doi.org/10.22323/1.098.0016
How to cite
Metadata are provided both in "article" format (very similar to INSPIRE) as this helps creating very compact bibliographies which can be beneficial to authors and readers, and in "proceeding" format which is more detailed and complete.
Open Access
Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.
Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.