Main Image
Volume 098 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD09) - Thu 1 October Morning
Determination of Si wafer resistivity distributions by C-V measurements
A.J. Kordyasz,* M. Kowalczyk, W. Bednarek, L. Bardelli, L. Lavergne, J. Sarnecki, M. Kisielinski, A. Brzozowski, K. Pytel, J. Tarasiuk, P. Grabiec, A. Panas
*corresponding author
Full text: pdf
Published on: 2010 June 28
Open Access
Creative Commons LicenseCopyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.