X-Ray measurements of radiation hard monolithic CMOS sensors at Diamond Light Source
M. Mironova*, K. Metodiev, P.P. Allport, I. Berdalović, D. Bortoletto, C. Buttar,
R. Cardella, V. Dao, M. Dyndal, P.M. Freeman, L. Flores Sanz de Acedo, L. Gonella, T. Kugathasan, H. Pernegger, F. Piro, R. Plackett, P. Riedler, A. Sharma, E.J. Schioppa, I. Shipsey, C. Solans Sanchez, W. Snoeys, H. Wennlöf, D. Weatherill, D. Wood, S. Worm on behalf of the MALTA teamet al. (click to show)
Pre-published on:
February 03, 2020
Published on:
September 14, 2020
Abstract
This contribution outlines the results of investigations into the effects of radiation damage in the mini-MALTA depleted monolithic pixel sensor prototype using a micro-focus X-ray beam at Diamond Light Source. The in-pixel photon response was measured for three different pixel design variations: one with the standard continuous $\mathrm{n^-}$ layer layout and standard front-end, and extra deep p-well and $\mathrm{n^-}$ gap designs with a modified front-end. The standard design showed a decrease of 12\% in pixel response after irradiation to 1e15 $\mathrm{n_{eq}/cm^2}$. The two new designs did not show a significant decrease in pixel response after irradiation.
DOI: https://doi.org/10.22323/1.373.0054
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