Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
K. Shibin*, G. Auzinger, H. Bakhshiansohi, A. Dabrowski, A. Dierlamm, M. Dragicevic, A. Gholami, G. Gómez, M. Guthoff, M. Haranko, A. Honma, M. Jenihhin, J. Kaplon, O. Karacheban, B. Korcsmáros, A. Lokhovtskiy, R. Loos, S. Mallows, J. Michel, V. Myronenko, G. Pásztor, J. Schwandt, M. Sedghi, A. Shevelev, G. Steinbrueck, D.P. Stickland and G. Jan Wegrzynet al. (click to show)
*: corresponding author
Full text: pdf
Pre-published on: April 24, 2025
Published on: July 29, 2025
Abstract
The high-luminosity upgrade of the LHC (HL-LHC) brings unprecedented requirements for
precision bunch-by-bunch luminosity measurement and beam-induced background monitoring in
real time. A key component of the CMS Beam Radiation Instrumentation and Luminosity detector
system is a stand-alone luminometer, the Fast Beam Condition Monitor (FBCM), which is able
to operate independently at all times with a triggerless asynchronous readout. FBCM utilizes
a dedicated front-end ASIC to amplify the signals from CO2-cooled Si-pad sensors with 1 ns
timing resolution. Front-end (FE) electronics are subject to high-radiation conditions, thus all
components are radiation hardened: sensors, ASICs, transceivers, etc. The FBCM ASIC contains
6 channels, each outputting a binary high-speed signal carrying the time-of-arrival and time-over-
threshold information. This signal is sent via a gigabit optical link to the back-end electronics for
analysis. A dedicated test system is designed for the FBCM FE electronics with a modular setup
for all testing needs of the project from initial ASIC validation test to system-level testing with the
full read-out chain. The paper reports on the design, read-out architecture, and testing program
for the FBCM electronics.
DOI: https://doi.org/10.22323/1.468.0063
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