The Silicon Vertex Detector of the Belle II Experiment
A.B. Kaliyar*,
K. Adamczyk,
L. Aggarwal,
H. Aihara,
T. Aziz,
S. Bacher,
S. Bahinipati, G. Batignani, J. Baudot, P.K. Behera, S. Bettarini, T. Bilka, A. Bozek, F. Buchsteiner, G. Casarosa, L. Corona, S. Das, G. Dujany, C. Finck, F. Forti, M. Friedl, A. Gabrielli, B. Gobbo, S. Halder, K. Hara, S. Hazra, T. Higuchi, C. Irmler, A. Ishikawa, Y. Jin, M. Kaleta, J. Kandra, K.H. Kang, P. Kodyš, T. Kohriki, R. Kumar, K. Lalwani, K. Lautenbach, R. Leboucher, S.C. Lee, J. Libby, L. Martel, L. Massaccesi, G.B. Mohanty, S. Mondal, K.R. Nakamura, Z. Natkaniec, Y. Onuki, F. Otani, A. Paladino, E. Paoloni, H. Park, L. Polat, K.K. Rao, I. Ripp-Baudot, G. Rizzo, Y. Sato, C. Schwanda, J. Serrano, T. Shimasaki, J. Suzuki, S. Tanaka, H. Tanigawa, F. Tenchini, R. Thalmeier, R. Tiwary, T. Tsuboyama, Y. Uematsu, L. Vitale, Z.M. Wang, J. Webb, O. Werbycka, J. Wiechczynski, H. Yin and L. Zaniet al. (click to show)*: corresponding author
Pre-published on:
April 24, 2025
Published on:
July 29, 2025
Abstract
The Belle II silicon vertex detector (SVD) is a four-layer double-sided silicon strip detector installed within the Belle II detector located at KEK, Japan. The SVD has been operating smoothly and
reliably since the start of data taking in March 2019. The data quality and radiation damage effects have been continuously monitored. In this article, we report the operational experience
of SVD, reconstruction performance, and effects of beam background and radiation damage. We also discuss some of the recent efforts to improve the software robustness targeting the high luminosity scenario and hardware activities performed during the first long shutdown of the Belle II experiment.
DOI: https://doi.org/10.22323/1.468.0114
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